CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing

I
ITC
2003
International Test Conference 2003 (ITC'03)
Abstract - CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing

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International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	B. Alorda, B. Bloechel, A. Keshavarzi, J. Segura, "CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing," Test Conference, International, pp. 719, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1270901, author = {B. Alorda and B. Bloechel and A. Keshavarzi and J. Segura}, title = {CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {719}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270901}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing SN - 1089-3539 SP EP A1 - B. Alorda, A1 - B. Bloechel, A1 - A. Keshavarzi, A1 - J. Segura, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

B. Alorda, Intel Corporation, Hillsboro, Oregon

B. Bloechel, Intel Corporation, Hillsboro, Oregon

A. Keshavarzi, Intel Corporation, Hillsboro, Oregon

J. Segura, Univ. de les Illes Balears, Dept. F?sica, Palma de Mallorca, Spain

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270901

We present a measurement module that computes the charge from the transient supply current and provides a digital value of this magnitude. The module is constructed to provide a feasible implementation of transient current testing in production-like environments. Experimental results demonstrate up to 1 GHz analog bandwidth, while the effective test speed is mainly determined by the A/D converter included in the module.

Citation:

B. Alorda, B. Bloechel, A. Keshavarzi, J. Segura, "CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing," itc, pp.719, International Test Conference 2003 (ITC'03), 2003

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