Adapting JTAG for AC Interconnect Testing

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International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Lee Whetsel, "Adapting JTAG for AC Interconnect Testing," Test Conference, International, pp. 641, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1270892, author = {Lee Whetsel}, title = {Adapting JTAG for AC Interconnect Testing}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {641}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270892}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Adapting JTAG for AC Interconnect Testing SN - 1089-3539 SP EP A1 - Lee Whetsel, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Lee Whetsel, Texas Instruments

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270892

The use of AC coupled interconnects to provide communication paths between devices is increasing. The existing IEEE 1149.1 boundary scan standard [1] (JTAG) has limitations that hinder it from being able to effectively test all AC coupled interconnects. This paper describes a simple enhancement to the JTAG architecture enabling it to operate in new modes facilitating AC interconnect testing.

Citation:

Lee Whetsel, "Adapting JTAG for AC Interconnect Testing," itc, pp.641, International Test Conference 2003 (ITC'03), 2003

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