loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
International Test Conference 2003 (ITC'03)
Test Vector Generation Based on Correlation Model for Ratio-Iddq
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
Xiaoyun Sun, University of Minnesota, Minneapolis
Larry Kinney, University of Minnesota, Minneapolis
Bapiraju Vinnakota, University of Minnesota, Minneapolis
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this paper we first study the reason for strong correlation between Iddq currents for different test vectors, then build a model to estimate the correlation. Based on this model, we propose three test vector selection methods to improve the fault detection ability of ratio-Iddq testing by selecting test vector pairs with the highest correlation. Hspice simulation showed that the fault detection ability can be improved by as much as an order of magnitude. We also describe a test vector partitioning technique to increase the correlation between Iddq currents of different test vectors.
Citation:
Xiaoyun Sun, Larry Kinney, Bapiraju Vinnakota, "Test Vector Generation Based on Correlation Model for Ratio-Iddq," itc, pp.545, International Test Conference 2003 (ITC'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.