Key Impediments to DFT-Focused Test and How to Overcome Them

I
ITC
2003
International Test Conference 2003 (ITC'03)
Abstract - Key Impediments to DFT-Focused Test and How to Overcome Them

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International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Ken Posse, Geir Eide, "Key Impediments to DFT-Focused Test and How to Overcome Them," Test Conference, International, pp. 503, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1270876, author = {Ken Posse and Geir Eide}, title = {Key Impediments to DFT-Focused Test and How to Overcome Them}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {503}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270876}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Key Impediments to DFT-Focused Test and How to Overcome Them SN - 1089-3539 SP EP A1 - Ken Posse, A1 - Geir Eide, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

Ken Posse, Teseda, Corporation

Geir Eide, Teseda, Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270876

In a carefully structured study spanning several months, the authors visited numerous companies focused on Design For Test methodologies in SoC Test, Characterization, and Failure Analysis. In interviews with the leading engineers in these projects, the various DFT structures and test processes used were studied. The results of the study revealed a number of impediments to the adoption of these processes on low-cost, DFT-focused testers. This paper presents some of the more glaring difficulties together with suggestions as to how they might be overcome.

Citation:

Ken Posse, Geir Eide, "Key Impediments to DFT-Focused Test and How to Overcome Them," itc, pp.503, International Test Conference 2003 (ITC'03), 2003

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