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International Test Conference 2003 (ITC'03)
IEEE 1149.6 - A Practical Perspective
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
x 
 
Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz, "IEEE 1149.6 - A Practical Perspective," Test Conference, International, pp. 494, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1270875,
author = {Bill Eklow and Carl Barnhart and Mike Ricchetti and Terry Borroz},
title = {IEEE 1149.6 - A Practical Perspective},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {494},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270875},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - IEEE 1149.6 - A Practical Perspective
SN - 1089-3539
SP
EP
A1 - Bill Eklow,
A1 - Carl Barnhart,
A1 - Mike Ricchetti,
A1 - Terry Borroz,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Bill Eklow, Cisco Systems Inc., San Jose CA
Carl Barnhart, Cadence Design Systems, Ojai, CA
Mike Ricchetti, Intellitech, Durham, NH
Terry Borroz, Teradyne, North Reading, MA
The IEEE 1149.6 standard was approved in March of 2003. The standard extends the capability of the IEEE 1149.1 standard to include AC-coupled and/or differential nets. These nets are predominant in new, multi-gigabit serial technology.
This paper will present a short overview of the 1149.6 standard and the issues that it addresses. The paper will then discuss design, verification and test considerations that must be dealt with when implementing 1149.6 logic on a component or a board. Since 1149.6 addresses a problem that is in part analog in nature, there are several new issues that must be dealt with which are not covered in previous 1149 based standards. The paper discusses the nature of these issues and their impact on design, verification and test. The paper is intended to be tutorial, providing tips and techniques to allow the user to quickly understand and implement an 1149.6 based design.
Citation:
Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz, "IEEE 1149.6 - A Practical Perspective," itc, pp.494, International Test Conference 2003 (ITC'03), 2003
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