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International Test Conference 2003 (ITC'03)
A New Approach for Low Power Scan Testing
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
x 
 
Takaki Yoshida, Masafumi Watati, "A New Approach for Low Power Scan Testing," Test Conference, International, pp. 480, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1270873,
author = {Takaki Yoshida and Masafumi Watati},
title = {A New Approach for Low Power Scan Testing},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {480},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270873},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - A New Approach for Low Power Scan Testing
SN - 1089-3539
SP
EP
A1 - Takaki Yoshida,
A1 - Masafumi Watati,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Takaki Yoshida, Matsushita Electric Industrial Co., Ltd.
Masafumi Watati, Matsushita Electric Industrial Co., Ltd.
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we have found that power supply voltage drops cause testing problems during shift operations in scan testing and we have analyzed this phenomenon and its causes. In this paper, we present a new testing method named MD-SCAN (Multi Duty-Scan) which solves power supply voltage drop problems in scan testing, as well as offering an efficient method of application.
Citation:
Takaki Yoshida, Masafumi Watati, "A New Approach for Low Power Scan Testing," itc, pp.480, International Test Conference 2003 (ITC'03), 2003
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