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International Test Conference 2003 (ITC'03)
A High Precision IDDQ Measurement System With Improved Dynamic Load Regulation
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
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Nobuhiro Sato, Yoshihiro Hashimoto, "A High Precision I<sub>DDQ</sub> Measurement System With Improved Dynamic Load Regulation," Test Conference, International, pp. 410, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1270865,
author = {Nobuhiro Sato and Yoshihiro Hashimoto},
title = {A High Precision I<sub>DDQ</sub> Measurement System With Improved Dynamic Load Regulation},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {410},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270865},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - A High Precision I<sub>DDQ</sub> Measurement System With Improved Dynamic Load Regulation
SN - 1089-3539
SP
EP
A1 - Nobuhiro Sato,
A1 - Yoshihiro Hashimoto,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Nobuhiro Sato, Advantest Corp., Japan
Yoshihiro Hashimoto, Advantest Corp., Japan
This paper describes a system for performing high precision IDDQ measurement of CMOS ICs having a large peak current during operation. Although the measurement rate is at a low speed of 200uS, the average current of up to 1A during operation may be accepted by improving the dynamic load regulation. This system is also applicable to conventional testing apparatus. This paper covers problems in IDDQ testing, solution for the problems, embodiment of each circuit, verification of the results, conclusion and future issues.
Citation:
Nobuhiro Sato, Yoshihiro Hashimoto, "A High Precision IDDQ Measurement System With Improved Dynamic Load Regulation," itc, pp.410, International Test Conference 2003 (ITC'03), 2003
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