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International Test Conference 2003 (ITC'03)
Fault Localization using Time Resolved Photon Emission and STIL Waveforms
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
x 
 
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah, "Fault Localization using Time Resolved Photon Emission and STIL Waveforms," Test Conference, International, pp. 254, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
x
 
@article{ 10.1109/TEST.2003.1270847,
author = {Romain Desplats and Felix Beaudoin and Philippe Perdu and Nagamani Nataraj and Ted Lundquist and Ketan Shah},
title = {Fault Localization using Time Resolved Photon Emission and STIL Waveforms},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {254},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270847},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Fault Localization using Time Resolved Photon Emission and STIL Waveforms
SN - 1089-3539
SP
EP
A1 - Romain Desplats,
A1 - Felix Beaudoin,
A1 - Philippe Perdu,
A1 - Nagamani Nataraj,
A1 - Ted Lundquist,
A1 - Ketan Shah,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Romain Desplats, CNES- French Space Agency, France
Felix Beaudoin, CNES- French Space Agency, France
Philippe Perdu, CNES- French Space Agency, France
Nagamani Nataraj, NPTest, San Jose, CA
Ted Lundquist, NPTest, San Jose, CA
Ketan Shah, NPTest, San Jose, CA
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) rather than determining the voltage states. Comparing measured waveforms with simulations (STIL/VCD) localizes functional faults and timing issues.
Citation:
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah, "Fault Localization using Time Resolved Photon Emission and STIL Waveforms," itc, pp.254, International Test Conference 2003 (ITC'03), 2003
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