Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran Chatty, Mujahid Muhammad, Pia Sanda, "Optical and Electrical Testing of Latchup in I/O Interface Circuits," Test Conference, International, pp. 236, International Test Conference 2003 (ITC'03), 2003.

@article{ 10.1109/TEST.2003.1270845,
author = {Franco Stellari and Peilin Song and Moyra K. McManus and Robert Gauthier and Alan J. Weger and Kiran Chatty and Mujahid Muhammad and Pia Sanda},
title = {Optical and Electrical Testing of Latchup in I/O Interface Circuits},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {236},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270845},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Test Conference, International
TI - Optical and Electrical Testing of Latchup in I/O Interface Circuits
SN - 1089-3539
SP
EP
A1 - Franco Stellari,
A1 - Peilin Song,
A1 - Moyra K. McManus,
A1 - Robert Gauthier,
A1 - Alan J. Weger,
A1 - Kiran Chatty,
A1 - Mujahid Muhammad,
A1 - Pia Sanda,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -