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International Test Conference 2003 (ITC'03)
Data flow within an open architecture tester
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
ASCII Text
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Maurizio Gavardoni, "Data flow within an open architecture tester," Test Conference, International, pp. 185, International Test Conference 2003 (ITC'03), 2003.
 
 
BibTex
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@article{ 10.1109/TEST.2003.1270839,
author = {Maurizio Gavardoni},
title = {Data flow within an open architecture tester},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {185},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270839},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Data flow within an open architecture tester
SN - 1089-3539
SP
EP
A1 - Maurizio Gavardoni,
PY - 2003
KW - null
VL - 0
JA - Test Conference, International
ER -
 
An open architecture tester allows a third party to develop its own instrument. Such a tester must be open in the sense that it needs to be able to integrate this instrument with minimal or no impact on the overall performance and cost. It is therefore fundamental that the data flow and synchronization among all the instruments in an open architecture tester be efficient. One of these two key topics, the data flow, is discussed in this paper. Some possible solutions that optimize the data flow are presented and one among them is given in full detail. Synchronization is a very wide topic whose discussion could be the subject for a separate paper.
Citation:
Maurizio Gavardoni, "Data flow within an open architecture tester," itc, pp.185, International Test Conference 2003 (ITC'03), 2003
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