Amir Hekmatpour, James Coulter, "Coverage-Directed Management and Optimization of Random Functional Verification," Test Conference, International, pp. 148, International Test Conference 2003 (ITC'03), 2003.

@article{ 10.1109/TEST.2003.1270835,
author = {Amir Hekmatpour and James Coulter},
title = {Coverage-Directed Management and Optimization of Random Functional Verification},
journal ={Test Conference, International},
volume = {0},
year = {2003},
issn = {1089-3539},
pages = {148},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270835},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Test Conference, International
TI - Coverage-Directed Management and Optimization of Random Functional Verification
SN - 1089-3539
SP
EP
A1 - Amir Hekmatpour,
A1 - James Coulter,
PY - 2003
KW - This paper describes a functional verification methodology based on a system developed at the IBM Microelectronics Embedded PowerPC Design Center
KW - in order to improve the coverage and convergence of random test generators in general and model-based random test generators in particular. It outlines specific tasks and methods devised for qualifying the test generators at various stages of the functional verification process to ensure the integrity of generated tests. It describes methods for calibrating the test generation process to improve functional coverage. In addition
KW - it outlines a strategy for improved management and control of the test generation for faster convergence across corner cases
KW - complex scenarios
KW - and deep interdependencies. The described methodology and its associated verification platform are deployed at the IBM Embedded PowerPC Design Center in Research Triangle Park
KW - North Carolina and has been used in the verification of 4XX and 4XXFPU family of PowerPC Processors.
VL - 0
JA - Test Conference, International
ER -