Fault Injection for Verifying Testability at the VHDL Level

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by S. R. Seward Articles by P. K. Lala

International Test Conference 2003 (ITC'03)

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	S. R. Seward, P. K. Lala, "Fault Injection for Verifying Testability at the VHDL Level," Test Conference, International, pp. 131, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1270833, author = {S. R. Seward and P. K. Lala}, title = {Fault Injection for Verifying Testability at the VHDL Level}, journal ={Test Conference, International}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {131}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270833}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Fault Injection for Verifying Testability at the VHDL Level SN - 1089-3539 SP EP A1 - S. R. Seward, A1 - P. K. Lala, PY - 2003 KW - null VL - 0 JA - Test Conference, International ER -

S. R. Seward, University of Arkansas, Fayetteville

P. K. Lala, University of Arkansas, Fayetteville

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270833

This paper presents a technique to improve verification at the VHDL level of digital circuits by means of a specially designed fault injection block. The injection technique allows incorporation of both transient and permanent faults to varying levels of VHDL hierarchy, and helps in verifying the performance of a testable system.

Citation:

S. R. Seward, P. K. Lala, "Fault Injection for Verifying Testability at the VHDL Level," itc, pp.131, International Test Conference 2003 (ITC'03), 2003

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.