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International Test Conference 2003 (ITC'03)
Effects of Deterministic Jitter in a Cable on Jitter Tolerance Measurements
Charlotte, NC, USA
September 30-October 02
ISBN: 0-7803-8107-6
Takahiro J. Yamaguchi, Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Mani Soma, University of Washington, Seattle, WA
Masahiro Ishida, Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Makoto Kurosawa, Advantest Corporation, Gunma, Japan
Hirobumi Musha, Advantest Corporation, Gunma, Japan
This paper presents a new jitter tolerance model that includes the effect of deterministic jitter in interconnects. First, it is shown by experiment that the deterministic jitter in a cable can significantly affect its jitter tolerance. Then, the new jitter tolerance model is verified with experimental data on cables of various lengths, using both PRBS and T11 test patterns.
Citation:
Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Makoto Kurosawa, Hirobumi Musha, "Effects of Deterministic Jitter in a Cable on Jitter Tolerance Measurements," itc, pp.58, International Test Conference 2003 (ITC'03), 2003
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