Neighbor Selection for Variance Reduction in I<sub>DDQ</sub> and Other Parametric Data

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - Neighbor Selection for Variance Reduction in I<sub>DDQ</sub> and Other Parametric Data

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International Test Conference 2002 (ITC'02)

Neighbor Selection for Variance Reduction in I_DDQ and Other Parametric Data

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	W. Robert Daasch, Kevin Cota, James McNames, Robert Madge, "Neighbor Selection for Variance Reduction in I<sub>DDQ</sub> and Other Parametric Data," Test Conference, International, pp. 1240, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041882, author = {W. Robert Daasch and Kevin Cota and James McNames and Robert Madge}, title = {Neighbor Selection for Variance Reduction in I<sub>DDQ</sub> and Other Parametric Data}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {1240}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041882}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Neighbor Selection for Variance Reduction in I<sub>DDQ</sub> and Other Parametric Data SN - 0-7803-7543-2 SP EP A1 - W. Robert Daasch, A1 - Kevin Cota, A1 - James McNames, A1 - Robert Madge, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

W. Robert Daasch, Portland State University

Kevin Cota, Portland State University

James McNames, Portland State University

Robert Madge, LSI Logic Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041882

The subject of this paper is variance reduction and Nearest Neighbor Residual estimates for I_DDQ and other continuous-valued test measurements. The key, new concept introduced is data-driven neighborhood identification about a die to reduce the variance of good and faulty I_DDQ distributions. Using LSI Logic production data, neighborhood selection techniques are demonstrated. The main contribution of the paper is variance reduction by the systematic use of the die location and wafer-or lot-level patterns and improved identification of die outliers of continuous-valued test data such as I_DDQ.

Citation:

W. Robert Daasch, Kevin Cota, James McNames, Robert Madge, "Neighbor Selection for Variance Reduction in I_DDQ and Other Parametric Data," itc, pp.1240, International Test Conference 2002 (ITC'02), 2002

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