Karim Arabi,
"Mixed-Signal BIST: Fact or Fiction,"
Test Conference, International, pp. 1202, International Test Conference 2002 (ITC'02), 2002.
BibTex
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@article{
10.1109/TEST.2002.1041908, author = {Karim Arabi}, title = {Mixed-Signal BIST: Fact or Fiction}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {1202}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041908}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Test Conference, International TI - Mixed-Signal BIST: Fact or Fiction SN - 0-7803-7543-2 SP EP A1 - Karim Arabi, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -
Depending on your expectations or claims, mixed-signal BIST could be either fact or fiction. Recognizing facts from fiction is key for the industry to successfully deploy mixed-signal BIST potentials.
Citation:
Karim Arabi, "Mixed-Signal BIST: Fact or Fiction," itc, pp.1202, International Test Conference 2002 (ITC'02), 2002
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