Adapting an SoC to ATE Concurrent Test Capabilities

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - Adapting an SoC to ATE Concurrent Test Capabilities

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Rainer Dorsch, Ram?n Huerta Rivera, Hans-Joachim Wunderlich, Martin Fischer, "Adapting an SoC to ATE Concurrent Test Capabilities," Test Conference, International, pp. 1169, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041875, author = {Rainer Dorsch and Ram?n Huerta Rivera and Hans-Joachim Wunderlich and Martin Fischer}, title = {Adapting an SoC to ATE Concurrent Test Capabilities}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {1169}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041875}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Adapting an SoC to ATE Concurrent Test Capabilities SN - 0-7803-7543-2 SP EP A1 - Rainer Dorsch, A1 - Ram?n Huerta Rivera, A1 - Hans-Joachim Wunderlich, A1 - Martin Fischer, PY - 2002 KW - ATE KW - Concurrent Test KW - SoC Test KW - Test Resource Partitioning VL - 0 JA - Test Conference, International ER -

Rainer Dorsch, University of Stuttgart

Ram?n Huerta Rivera, University of Stuttgart

Hans-Joachim Wunderlich, University of Stuttgart

Martin Fischer, Agilent Technologies

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041875

Concurrent test features are available in the SoC testers to increase ATE throughput. To exploit these new features design modifications are necessary. In a case study, these modifications were applied to the open source LEON SoC platform containing an embedded 32 bit CPU, an AMBA bus, and several embedded cores. The concurrent test of LEON was performed on an SoC tester. The gain in test application time and area costs are quantified and obstacles in the design flow or concurrent test are discussed.

Index Terms:

ATE, Concurrent Test, SoC Test, Test Resource Partitioning

Citation:

Rainer Dorsch, Ram?n Huerta Rivera, Hans-Joachim Wunderlich, Martin Fischer, "Adapting an SoC to ATE Concurrent Test Capabilities," itc, pp.1169, International Test Conference 2002 (ITC'02), 2002

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