Scan-Based Transition Fault Testing — Implementation and Low Cost Test Challenges

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - Scan-Based Transition Fault Testing — Implementation and Low Cost Test Challenges

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Jayashree Saxena, Kenneth M. Butler, John Gatt, R Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech, "Scan-Based Transition Fault Testing — Implementation and Low Cost Test Challenges," Test Conference, International, pp. 1120, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041869, author = {Jayashree Saxena and Kenneth M. Butler and John Gatt and R Raghuraman and Sudheendra Phani Kumar and Supatra Basu and David J. Campbell and John Berech}, title = {Scan-Based Transition Fault Testing — Implementation and Low Cost Test Challenges}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {1120}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041869}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Scan-Based Transition Fault Testing — Implementation and Low Cost Test Challenges SN - 0-7803-7543-2 SP EP A1 - Jayashree Saxena, A1 - Kenneth M. Butler, A1 - John Gatt, A1 - R Raghuraman, A1 - Sudheendra Phani Kumar, A1 - Supatra Basu, A1 - David J. Campbell, A1 - John Berech, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Jayashree Saxena, Texas Instruments Inc.

Kenneth M. Butler, Texas Instruments Inc.

John Gatt, Texas Instruments Inc.

R Raghuraman, Texas Instruments Inc.

Sudheendra Phani Kumar, Texas Instruments Inc.

Supatra Basu, Texas Instruments Inc.

David J. Campbell, Texas Instruments Inc.

John Berech, Texas Instruments Inc.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041869

The semiconductor industry as a whole is growing increasingly concerned about the possible presence of delay-inducing defects. There exist structured test generation and application techniques which can detect them, but there are many practical issues associated with their use. These problems are particularly acute when using low cost test equipment. In this paper, we describe an overall approach for implementing scan-based delay testing with emphasis on low-cost test.

Citation:

Jayashree Saxena, Kenneth M. Butler, John Gatt, R Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech, "Scan-Based Transition Fault Testing — Implementation and Low Cost Test Challenges," itc, pp.1120, International Test Conference 2002 (ITC'02), 2002

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