Application of High-Quality Built-In Test to Industrial Designs

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - Application of High-Quality Built-In Test to Industrial Designs

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo, "Application of High-Quality Built-In Test to Industrial Designs," Test Conference, International, pp. 1003, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041856, author = {Kazumi Hatayama and Michinobu Nakao and Yoshikazu Kiyoshige and Koichiro Natsume and Yasuo Sato and Takaharu Nagumo}, title = {Application of High-Quality Built-In Test to Industrial Designs}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {1003}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041856}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Application of High-Quality Built-In Test to Industrial Designs SN - 0-7803-7543-2 SP EP A1 - Kazumi Hatayama, A1 - Michinobu Nakao, A1 - Yoshikazu Kiyoshige, A1 - Koichiro Natsume, A1 - Yasuo Sato, A1 - Takaharu Nagumo, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Kazumi Hatayama, Hitachi, Ltd.

Michinobu Nakao, Hitachi, Ltd.

Yoshikazu Kiyoshige, Hitachi, Ltd.

Koichiro Natsume, Hitachi, Ltd.

Yasuo Sato, Hitachi, Ltd.

Takaharu Nagumo, Hitachi, Ltd.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041856

This paper presents an approach for high-quality built-in test using a neighborhood pattern generator (NPG). Proposed NPG is practically acceptable because (a) its structure is independent of circuit under test, (b) it requires low area overhead and no performance degradation, and (c) it can encode deterministic test cubes, not only for stuck-at faults but also transition faults, with high probability. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.

Citation:

Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo, "Application of High-Quality Built-In Test to Industrial Designs," itc, pp.1003, International Test Conference 2002 (ITC'02), 2002

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