Improved I<sub>DDQ</sub> Testing with Empirical Linear Prediction

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - Improved I<sub>DDQ</sub> Testing with Empirical Linear Prediction

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International Test Conference 2002 (ITC'02)

Improved I_DDQ Testing with Empirical Linear Prediction

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	David I. Bergman, Hans Engler, "Improved I<sub>DDQ</sub> Testing with Empirical Linear Prediction," Test Conference, International, pp. 954, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041851, author = {David I. Bergman and Hans Engler}, title = {Improved I<sub>DDQ</sub> Testing with Empirical Linear Prediction}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {954}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041851}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Improved I<sub>DDQ</sub> Testing with Empirical Linear Prediction SN - 0-7803-7543-2 SP EP A1 - David I. Bergman, A1 - Hans Engler, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

David I. Bergman, National Institute of Standards and Technology

Hans Engler, Georgetown University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041851

A new linear prediction method that improves I_DDQ test effectivenes is described. The method uses statistical pre-processing of exhaustive measurements on training devices to extract principal patterns in the device I_DDQ behavior and to generate a prediction model. Fitting the model to device measurements accommodates variation in the fabrication process. Comparison with the Delta I_DDQ test method using the SEMATECH S-121 data shows that for nearly equal numbers of defective parts passed, the new method fails fewer defect-free parts.

Citation:

David I. Bergman, Hans Engler, "Improved I_DDQ Testing with Empirical Linear Prediction," itc, pp.954, International Test Conference 2002 (ITC'02), 2002

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