Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	B. Alorda, M. Rosales, J. Soden, C. Hawkins, J. Segura, "Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs," Test Conference, International, pp. 947, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041850, author = {B. Alorda and M. Rosales and J. Soden and C. Hawkins and J. Segura}, title = {Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {947}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041850}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs SN - 0-7803-7543-2 SP EP A1 - B. Alorda, A1 - M. Rosales, A1 - J. Soden, A1 - C. Hawkins, A1 - J. Segura, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

B. Alorda, University Illes Balears

M. Rosales, University Illes Balears

J. Soden, Sandia National Laboratories

C. Hawkins, University of New Mexico

J. Segura, University Illes Balears

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041850

We analyze a transient current testing technique that measures and computes the charge delivered to the circuit during the transient operation. The method was applied to 0.5 ?m CMOS SRAMs that passed various logic tests. Results indicate that Charge Based Testing (CBT) can successfully test submicron ICs since it tolerates large and variable background currents, can be applied to non fully static circuits, and clearly shows outlier parts. CBT is a sensitive, physical test correlating transient charge injected to the properties of particular transistors that switch during selected patterns. This gives CBT an efficient diagnostic capability. A compact hardware module to compute CBT was demonstrated previously.

Citation:

B. Alorda, M. Rosales, J. Soden, C. Hawkins, J. Segura, "Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs," itc, pp.947, International Test Conference 2002 (ITC'02), 2002

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