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International Test Conference 2002 (ITC'02)
Efficient Design of System Test: A Layered Architecture
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
ASCII Text
x 
 
Andrea Baldini, Alfredo Benso, Paolo Prinetto, Sergio Mo, Andrea Taddei, "Efficient Design of System Test: A Layered Architecture," Test Conference, International, pp. 930, International Test Conference 2002 (ITC'02), 2002.
 
 
BibTex
x
 
@article{ 10.1109/TEST.2002.1041848,
author = {Andrea Baldini and Alfredo Benso and Paolo Prinetto and Sergio Mo and Andrea Taddei},
title = {Efficient Design of System Test: A Layered Architecture},
journal ={Test Conference, International},
volume = {0},
year = {2002},
isbn = {0-7803-7543-2},
pages = {930},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041848},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Efficient Design of System Test: A Layered Architecture
SN - 0-7803-7543-2
SP
EP
A1 - Andrea Baldini,
A1 - Alfredo Benso,
A1 - Paolo Prinetto,
A1 - Sergio Mo,
A1 - Andrea Taddei,
PY - 2002
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Andrea Baldini, Politecnico di Torino
Alfredo Benso, Politecnico di Torino
Paolo Prinetto, Politecnico di Torino
Sergio Mo, Magneti Marelli Electronic Systems
Andrea Taddei, Magneti Marelli Electronic Systems

Starting from the idea of a general methodology to transform design specifications into system level functional test patterns for complex embedded systems, we propose a layered architecture as basis of such process. The architecture aims at strongly simplifying the test design, allowing the test engineer to concentrate on the high level parts of the system and wrapping all the complexity of the test environment.

The results are then verified on a complex case study of automotive applications.

Citation:
Andrea Baldini, Alfredo Benso, Paolo Prinetto, Sergio Mo, Andrea Taddei, "Efficient Design of System Test: A Layered Architecture," itc, pp.930, International Test Conference 2002 (ITC'02), 2002
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