New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Masashi Shimanouchi, "New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing," Test Conference, International, pp. 903, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041845, author = {Masashi Shimanouchi}, title = {New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {903}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041845}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing SN - 0-7803-7543-2 SP EP A1 - Masashi Shimanouchi, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Masashi Shimanouchi, NPTest

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041845

Signal paths in ATE Pin Electronics need a fresh examination in order to address the challenges of serial data communication (serialcom) device testing. The effects of limited frequency bandwidth of the DUT signal path can introduce non-negligible amounts of data-dependent jitter in the jitter testing. This effect has not been previously discussed with respect to ATE. The frequency bandwidth effects become even more critical at the speeds expected in the near future. This paper proposes new signal paths in ATE, studies the basics of the tools used for frequency bandwidth investigation and reviews some fundamental frequency bandwidth effects in ATE.

Citation:

Masashi Shimanouchi, "New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing," itc, pp.903, International Test Conference 2002 (ITC'02), 2002

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