Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs

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	Similar Articles Articles by Carsten Wegener Articles by Michael Peter Kennedy

International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Carsten Wegener, Michael Peter Kennedy, "Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs," Test Conference, International, pp. 851, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041839, author = {Carsten Wegener and Michael Peter Kennedy}, title = {Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {851}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041839}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs SN - 0-7803-7543-2 SP EP A1 - Carsten Wegener, A1 - Michael Peter Kennedy, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Carsten Wegener, University College Cork

Michael Peter Kennedy, University College Cork

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041839

The Linear Error Mechanism Modeling Algorithm (LEMMA [1]) has been developed with the aim of reducing test costs for DACs and ADCs, a particularly important class of mixed-signal integrated circuits. In this contribution, for the example of a 12-bit ADC, we report on the development and verification of LEMMA in an industrial production test environment. From the insight gained, we estimate the requirements and return-of-investment for higher resolution devices where traditional test techniques exhaust the time budget allowed for testing commodity parts.

Citation:

Carsten Wegener, Michael Peter Kennedy, "Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs," itc, pp.851, International Test Conference 2002 (ITC'02), 2002

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