An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes

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	Similar Articles Articles by Zhigang Jiang Articles by Sandeep K. Gupta

International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Zhigang Jiang, Sandeep K. Gupta, "An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes," Test Conference, International, pp. 824, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041836, author = {Zhigang Jiang and Sandeep K. Gupta}, title = {An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {824}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041836}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes SN - 0-7803-7543-2 SP EP A1 - Zhigang Jiang, A1 - Sandeep K. Gupta, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Zhigang Jiang, University of Southern California

Sandeep K. Gupta, University of Southern California

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041836

When VLSI scaling reaches closer to the limits of laws of physics and to the limits of fabrication processes, yields will decrease, especially at desired speed. However, for a large class of applications, chips need not be perfect to be acceptable. In this paper, we describe the notion of threshold testing that can help improve effective yield for future processes. We then develop an ATPG and demonstrate that significant increase in effective yield can be attained at negligible increase in test application cost.

Citation:

Zhigang Jiang, Sandeep K. Gupta, "An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes," itc, pp.824, International Test Conference 2002 (ITC'02), 2002

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