Automatic Scan Insertion and Test Generation for Asynchronous Circuits

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Frank te Beest, Ad Peeters, Marc Verra, Kees van Berkel, Hans Kerkhoff, "Automatic Scan Insertion and Test Generation for Asynchronous Circuits," Test Conference, International, pp. 804, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041834, author = {Frank te Beest and Ad Peeters and Marc Verra and Kees van Berkel and Hans Kerkhoff}, title = {Automatic Scan Insertion and Test Generation for Asynchronous Circuits}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {804}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041834}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Automatic Scan Insertion and Test Generation for Asynchronous Circuits SN - 0-7803-7543-2 SP EP A1 - Frank te Beest, A1 - Ad Peeters, A1 - Marc Verra, A1 - Kees van Berkel, A1 - Hans Kerkhoff, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Frank te Beest, University of Twente

Ad Peeters, Philips Research Laboratories

Marc Verra, Philips Research Laboratories

Kees van Berkel, Philips Research Laboratories and Eindhoven University of Technology

Hans Kerkhoff, University of Twente

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041834

A test method for asynchronous handshake circuits presented that is based on synchronous full-scan techniques. The method adds a synchronous test mode to the circuit, in which the entire circuit is controlled by external clocks. This enables the use of conventional test generation tools. The method resulted in an operational flow, capable of automatically testing any handshake circuit with test-quality equal to synchronous circuits. Several circuits have been evaluated, demonstrating over 99% stuck-at fault coverage.

Citation:

Frank te Beest, Ad Peeters, Marc Verra, Kees van Berkel, Hans Kerkhoff, "Automatic Scan Insertion and Test Generation for Asynchronous Circuits," itc, pp.804, International Test Conference 2002 (ITC'02), 2002

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