A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter

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	Similar Articles Articles by Takahiro J. Yamaguchi Articles by Mani Soma Articles by Masahiro Ishida Articles by Hirobumi Musha Articles by Louis Malarsie

International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie, "A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter," Test Conference, International, pp. 717, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041824, author = {Takahiro J. Yamaguchi and Mani Soma and Masahiro Ishida and Hirobumi Musha and Louis Malarsie}, title = {A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {717}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041824}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter SN - 0-7803-7543-2 SP EP A1 - Takahiro J. Yamaguchi, A1 - Mani Soma, A1 - Masahiro Ishida, A1 - Hirobumi Musha, A1 - Louis Malarsie, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Takahiro J. Yamaguchi, Advantest Laboratories, Ltd.

Mani Soma, University of Washington

Masahiro Ishida, Advantest Laboratories, Ltd.

Hirobumi Musha, Advantest Corporation

Louis Malarsie, Agere Systems

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041824

This paper presents a new method for measuring jitter tolerance of a SerDes receiver using the timing misalignment between the jittered source clock and the recovered clock. A sinusoidal jitter is injected into the serial bit stream. The method derives an equation for estimating BER accurately and is 10X faster than the conventional BER test method. The accuracy and test speed of the method are verified by 2.5 Gbps and 10 Gbps-SerDes experiments.

Citation:

Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie, "A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter," itc, pp.717, International Test Conference 2002 (ITC'02), 2002

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