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International Test Conference 2002 (ITC'02)
Silicon Symptoms to Solutions: Applying Design for Debug Techniques
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
ASCII Text
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Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger, "Silicon Symptoms to Solutions: Applying Design for Debug Techniques," Test Conference, International, pp. 664, International Test Conference 2002 (ITC'02), 2002.
 
 
BibTex
x
 
@article{ 10.1109/TEST.2002.1041818,
author = {Carol Pyron and Rekha Bangalore and Dawit Belete and Jason Goertz and Ashutosh Razdan and Denise Younger},
title = {Silicon Symptoms to Solutions: Applying Design for Debug Techniques},
journal ={Test Conference, International},
volume = {0},
year = {2002},
isbn = {0-7803-7543-2},
pages = {664},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041818},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Silicon Symptoms to Solutions: Applying Design for Debug Techniques
SN - 0-7803-7543-2
SP
EP
A1 - Carol Pyron,
A1 - Rekha Bangalore,
A1 - Dawit Belete,
A1 - Jason Goertz,
A1 - Ashutosh Razdan,
A1 - Denise Younger,
PY - 2002
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Carol Pyron, Motorola, Inc.
Rekha Bangalore, Motorola, Inc.
Dawit Belete, Motorola, Inc.
Jason Goertz, Motorola, Inc.
Ashutosh Razdan, Motorola, Inc.
Denise Younger, Motorola, Inc.
Quick and accurate silicon debug is essential for short Time to Market schedules. This paper describes several actual silicon debug test cases to illustrate both the range of issues found only after silicon is available as well as the range of design for debug features used in the diagnostic process. Each test case starts with the symptoms found on the silicon and follows through to the problem definition and resolution. The debug test cases cover issues from logic and circuit errors to process issues. The designs in the test cases include Motorola?s MPC7410 and MPC7450 advanced microprocessors and DSP56621 digital signal processor.
Citation:
Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger, "Silicon Symptoms to Solutions: Applying Design for Debug Techniques," itc, pp.664, International Test Conference 2002 (ITC'02), 2002
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