Facilitating Rapid First Silicon Debug

I
ITC
2002
International Test Conference 2002 (ITC'02)
Abstract - Facilitating Rapid First Silicon Debug

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Hari Balachandran, Kenneth M. Butler, Neil Simpson, "Facilitating Rapid First Silicon Debug," Test Conference, International, pp. 628, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041814, author = {Hari Balachandran and Kenneth M. Butler and Neil Simpson}, title = {Facilitating Rapid First Silicon Debug}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {628}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041814}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Facilitating Rapid First Silicon Debug SN - 0-7803-7543-2 SP EP A1 - Hari Balachandran, A1 - Kenneth M. Butler, A1 - Neil Simpson, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Hari Balachandran, Texas Instruments

Kenneth M. Butler, Texas Instruments

Neil Simpson, Texas Instruments

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041814

Semiconductor manufacturers aim to deliver products to market within a short span of time in order to gain market share. There are several facets of introducing a product to market-Design, manufacturing, first silicon debug, and ramp to volume. Of these, first silicon debug time contributes significantly towards reduced product cycle time if it can be kept short. In this paper, we will discuss the infrastructure, design tools, test tools and debug tools required to achieve successful first silicon debug. We will describe a production device that employs these infrastructure requirements, thereby demonstrating the advantages of following the guidelines. The paper will also highlight the ill effects of not adhering to the guidelines.

Citation:

Hari Balachandran, Kenneth M. Butler, Neil Simpson, "Facilitating Rapid First Silicon Debug," itc, pp.628, International Test Conference 2002 (ITC'02), 2002

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