BIST-Based Diagnosis of FPGA Interconnect

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Charles Stroud Articles by Jeremy Nall Articles by Matthew Lashinsky Articles by Miron Abramovici

International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Charles Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici, "BIST-Based Diagnosis of FPGA Interconnect," Test Conference, International, pp. 618, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041813, author = {Charles Stroud and Jeremy Nall and Matthew Lashinsky and Miron Abramovici}, title = {BIST-Based Diagnosis of FPGA Interconnect}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {618}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041813}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - BIST-Based Diagnosis of FPGA Interconnect SN - 0-7803-7543-2 SP EP A1 - Charles Stroud, A1 - Jeremy Nall, A1 - Matthew Lashinsky, A1 - Miron Abramovici, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Charles Stroud, University of North Carolina at Charlotte

Jeremy Nall, University of North Carolina at Charlotte

Matthew Lashinsky, University of North Carolina at Charlotte

Miron Abramovici, Agere Systems

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041813

We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either on-line or off-line testing. The technique was originally intended for on-line diagnosis of faulty interconnect to support fault-tolerant applications. However, the technique has been proven to be an excellent approach for off-line testing and diagnosis as well, providing high-resolution diagnostics with the ability to identify the faulty wire segment or programmable switch. We have implemented this BIST-based diagnostic approach on the ORCA series FPGA and present the results of testing and diagnosing known defective FPGAs.¹

Citation:

Charles Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici, "BIST-Based Diagnosis of FPGA Interconnect," itc, pp.618, International Test Conference 2002 (ITC'02), 2002

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.