Experimental Evaluation of Scan Tests for Bridges

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	Similar Articles Articles by Sreejit Chakravarty Articles by Ankur Jain Articles by Nandakumar Radhakrishnan Articles by Eric W Savage Articles by Sujit T Zachariah

International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Sreejit Chakravarty, Ankur Jain, Nandakumar Radhakrishnan, Eric W Savage, Sujit T Zachariah, "Experimental Evaluation of Scan Tests for Bridges," Test Conference, International, pp. 509, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041801, author = {Sreejit Chakravarty and Ankur Jain and Nandakumar Radhakrishnan and Eric W Savage and Sujit T Zachariah}, title = {Experimental Evaluation of Scan Tests for Bridges}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {509}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041801}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Experimental Evaluation of Scan Tests for Bridges SN - 0-7803-7543-2 SP EP A1 - Sreejit Chakravarty, A1 - Ankur Jain, A1 - Nandakumar Radhakrishnan, A1 - Eric W Savage, A1 - Sujit T Zachariah, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Sreejit Chakravarty, Intel Corporation

Ankur Jain, Intel Corporation

Nandakumar Radhakrishnan, Intel Corporation

Eric W Savage, Intel Corporation

Sujit T Zachariah, Intel Corporation

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041801

An impressive body of theoretical research to model the behavior of bridges exits. We take that a step further and describe an experiment to compute single cycle scan tests for bridges and evaluate them in silicon. Experimental data, on a high volume part, shows that by marginally increasing the static bridge fault coverage of realistic bridges, unique parts missed by a comprehensive set of stuck-at tests were detected. We believe that this is the first silicon data on the value of adding single cycle scan tests for bridges to the manufacturing flow.

Citation:

Sreejit Chakravarty, Ankur Jain, Nandakumar Radhakrishnan, Eric W Savage, Sujit T Zachariah, "Experimental Evaluation of Scan Tests for Bridges," itc, pp.509, International Test Conference 2002 (ITC'02), 2002

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