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International Test Conference 2002 (ITC'02)
Isolating and Removing Sources of Variation in Test Data
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
David Turner, Portland State University
David Abercrombie, LSI Logic
James McNames, Portland State University
Robert Daasch, Portland State University
Robert Madge, LSI Logic
We describe new methods of data analysis that identify and isolate sources of variation in production test data based on its natural taxonomy. We also describe an alternative approach to data analysis that integrates disparate data by removing each primary source of variation. This new approach has several advantages compared to traditional "divide and conquer" techniques (e.g. ANOVA). For example, the new approach enables us to identify secondary sources of variation that are normally obscured by the primary source. The methods are demonstrated on a die-speed measurement collected from seventy lots of two products produced at two fabrication facilities.
Citation:
David Turner, David Abercrombie, James McNames, Robert Daasch, Robert Madge, "Isolating and Removing Sources of Variation in Test Data," itc, pp.464, International Test Conference 2002 (ITC'02), 2002
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