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International Test Conference 2002 (ITC'02)
Realizing the Benefits of Structural Test for Intel Microprocessors
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
ASCII Text
x 
 
Mike Mayberry, John Johnson, Navid Shahriari, Mike Tripp, "Realizing the Benefits of Structural Test for Intel Microprocessors," Test Conference, International, pp. 456, International Test Conference 2002 (ITC'02), 2002.
 
 
BibTex
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@article{ 10.1109/TEST.2002.1041795,
author = {Mike Mayberry and John Johnson and Navid Shahriari and Mike Tripp},
title = {Realizing the Benefits of Structural Test for Intel Microprocessors},
journal ={Test Conference, International},
volume = {0},
year = {2002},
isbn = {0-7803-7543-2},
pages = {456},
doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041795},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Realizing the Benefits of Structural Test for Intel Microprocessors
SN - 0-7803-7543-2
SP
EP
A1 - Mike Mayberry,
A1 - John Johnson,
A1 - Navid Shahriari,
A1 - Mike Tripp,
PY - 2002
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Mike Mayberry, Intel Corporation
John Johnson, Intel Corporation
Navid Shahriari, Intel Corporation
Mike Tripp, Intel Corporation
This paper traces the evolution of the distributed test strategy at Intel, covering both the tester platform, which is now on the 2nd generation, as well as the parallel evolution of the test content, which is optimized for this platform. We describe the distribution of Pentium? 4 processor test content between structural and functional platforms, associated fallout, and key issues encountered with content migration. Finally, we discuss future test content and platform trends as shaped by increasing device complexity and defect types.
Citation:
Mike Mayberry, John Johnson, Navid Shahriari, Mike Tripp, "Realizing the Benefits of Structural Test for Intel Microprocessors," itc, pp.456, International Test Conference 2002 (ITC'02), 2002
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