loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
International Test Conference 2002 (ITC'02)
An Effective Diagnosis Method to Support Yield Improvement
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
Camelia Hora, Eindhoven University of Technology
Rene Segers, Philips Semiconductors
Stefan Eichenberger, Philips Semiconductors
Maurice Lousberg, Philips Research Labs
The ability to achieve and maintain high yield levels depends on the capability of detecting, analyzing and correcting repetitive failure mechanisms. In this paper, a statistical fault diagnosis method based on using only the first or the first few failing test vectors is presented. The new approach is analyzing the failing vectors from an entire lot and produces a finite list of suspect locations, which are then subjected to further statistical and physical analysis. The results of the performed case studies show the usefulness of this method when applied in a production environment. We were able to detect repetitive failure mechanisms and accurately correlate electrical fail locations to in-line inspection data and thus greatly improve the accuracy of the determined kill ratio.
Citation:
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg, "An Effective Diagnosis Method to Support Yield Improvement," itc, pp.260, International Test Conference 2002 (ITC'02), 2002
Usage of this product signifies your acceptance of the Terms of Use.