A Persistent Diagnostic Technique for Unstable Defects

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, "A Persistent Diagnostic Technique for Unstable Defects," Test Conference, International, pp. 242, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041766, author = {Yasuo Sato and Iwao Yamazaki and Hiroki Yamanaka and Toshio Ikeda and Masahiro Takakura}, title = {A Persistent Diagnostic Technique for Unstable Defects}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {242}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041766}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - A Persistent Diagnostic Technique for Unstable Defects SN - 0-7803-7543-2 SP EP A1 - Yasuo Sato, A1 - Iwao Yamazaki, A1 - Hiroki Yamanaka, A1 - Toshio Ikeda, A1 - Masahiro Takakura, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Yasuo Sato, Hitachi, Ltd.

Iwao Yamazaki, Hitachi, Ltd.

Hiroki Yamanaka, Hitachi, Ltd.

Toshio Ikeda, Hitachi, Ltd.

Masahiro Takakura, Hitachi Engineering Co., Ltd.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041766

We present a persistent diagnostic technique for unstable defects, such as open defects or delay defects. A new "segment model" diagnosis for the completely open defects will be discussed. Here, we not only focus on the behavior of the principal offender, but also the behavior of the accomplices which cause the unstable behavior of the defect. In this paper, a technique using the layout information for an open faul diagnosis, and a testing method for the delay fault will be discussed. Some experimental results of actual chips will be shown.

Citation:

Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, "A Persistent Diagnostic Technique for Unstable Defects," itc, pp.242, International Test Conference 2002 (ITC'02), 2002

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