International Test Conference 2002 (ITC'02)
Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
In the past, Symbolic Trajectory Evaluation (STE) has been shown to be effective for verifying individual array blocks. However, when applying STE to verify multiple array blocks together as a single system, the run-time OBDD sizes would often blow up. In this paper, we propose the use of both ATPG-based justification engine and symbolic simulation to facilitate the application of STE proof methodology for array systems. Our method translates a given verification problem instance into ATPG justification objectives, and partitions a given design into ATPG and symbolic simulation domains. Then, by developing a scheme that enables ATPG justification engine to work closely with the symbolic simulator, the run-time OBDD sizes during each symbolic simulation run can be limited. We demonstrate the effectiveness of our approach by verifying the Memory Management Unit (MMU) in Motorola high-performance microprocessors. The verification of MMU as a whole was not possible before because of the OBDD size blow-up problem when symbolic simulation is used in the STE proof process.
Citation:
Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting (Tim) Cheng, Magdy S. Abadir, "Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems," itc, pp.203, International Test Conference 2002 (ITC'02), 2002