A Wavelet-Based Timing Parameter Extraction Method

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International Test Conference 2002 (ITC'02)

Baltimore, MD, USA

October 07-October 10

ISBN: 0-7803-7543-2

	ASCII Text	x
	Mani Soma, Welela Haileselassie, Jessica Yan, Rajesh Raina, "A Wavelet-Based Timing Parameter Extraction Method," Test Conference, International, pp. 120, International Test Conference 2002 (ITC'02), 2002.

	BibTex	x
	@article{ 10.1109/TEST.2002.1041752, author = {Mani Soma and Welela Haileselassie and Jessica Yan and Rajesh Raina}, title = {A Wavelet-Based Timing Parameter Extraction Method}, journal ={Test Conference, International}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {120}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041752}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - A Wavelet-Based Timing Parameter Extraction Method SN - 0-7803-7543-2 SP EP A1 - Mani Soma, A1 - Welela Haileselassie, A1 - Jessica Yan, A1 - Rajesh Raina, PY - 2002 KW - null VL - 0 JA - Test Conference, International ER -

Mani Soma, University of Washington

Welela Haileselassie, University of Washington

Jessica Yan, University of Washington

Rajesh Raina, Motorola Inc.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041752

A wavelet-based timing parameter extraction method applicable to computer and communication systems is presented. Experimental validation of this theoretical method is demonstrated with clock jitter estimation on a prototype microprocessor based on the PowerPC architecture, together with a comparison with existing techniques.

Citation:

Mani Soma, Welela Haileselassie, Jessica Yan, Rajesh Raina, "A Wavelet-Based Timing Parameter Extraction Method," itc, pp.120, International Test Conference 2002 (ITC'02), 2002

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