Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST

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	Similar Articles Articles by Chunsheng Liu Articles by Kumar N. Dwarakanath Articles by Krishnendu Chakrabarty Articles by Ronald D. (Shawn) Blanton

IEEE Computer Society Annual Symposium on VLSI: Emerging Trends in VLSI Systems Design (ISVLSI'04)

Lafayette, Louisiana

February 19-February 20

ISBN: 0-7695-2097-9

	ASCII Text	x
	Chunsheng Liu, Kumar N. Dwarakanath, Krishnendu Chakrabarty, Ronald D. (Shawn) Blanton, "Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST," VLSI, IEEE Computer Society Annual Symposium on, pp. 173, IEEE Computer Society Annual Symposium on VLSI: Emerging Trends in VLSI Systems Design (ISVLSI'04), 2004.

	BibTex	x
	@article{ 10.1109/ISVLSI.2004.1339526, author = {Chunsheng Liu and Kumar N. Dwarakanath and Krishnendu Chakrabarty and Ronald D. (Shawn) Blanton}, title = {Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST}, journal ={VLSI, IEEE Computer Society Annual Symposium on}, volume = {0}, year = {2004}, isbn = {0-7695-2097-9}, pages = {173}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2004.1339526}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI, IEEE Computer Society Annual Symposium on TI - Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST SN - 0-7695-2097-9 SP EP A1 - Chunsheng Liu, A1 - Kumar N. Dwarakanath, A1 - Krishnendu Chakrabarty, A1 - Ronald D. (Shawn) Blanton, PY - 2004 KW - null VL - 0 JA - VLSI, IEEE Computer Society Annual Symposium on ER -

Chunsheng Liu, University of Nebraska-Lincoln

Kumar N. Dwarakanath, Carnegie Mellon University

Krishnendu Chakrabarty, Duke University

Ronald D. (Shawn) Blanton, Carnegie Mellon University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2004.1339526

We address the problem of generating compact dictionaries for the diagnosis of unmodeled faults in scan-BIST. We present dictionary organization schemes that provide two orders of magnitude reduction in dictionary size with no significant loss in resolution, and facilitate the diagnosis of unmodeled faults. Experimental results for the ISCAS-89 benchmark circuits show that various types of unmodeled faults can be efficiently located using compact dictionaries generated for single stuck-at faults.

Citation:

Chunsheng Liu, Kumar N. Dwarakanath, Krishnendu Chakrabarty, Ronald D. (Shawn) Blanton, "Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST," isvlsi, pp.173, IEEE Computer Society Annual Symposium on VLSI: Emerging Trends in VLSI Systems Design (ISVLSI'04), 2004

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