Low Power Test Set Embedding Based on Phase Shifters

I
ISVLSI
2003
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'03)
Abstract - Low Power Test Set Embedding Based on Phase Shifters

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IEEE Computer Society Annual Symposium on VLSI (ISVLSI'03)

Tampa, Florida

February 20-February 21

ISBN: 0-7695-1904-0

	ASCII Text	x
	Maciej Bellos, Dimitri Kagaris, Dimitris Nikolos, "Low Power Test Set Embedding Based on Phase Shifters," VLSI, IEEE Computer Society Annual Symposium on, pp. 155, IEEE Computer Society Annual Symposium on VLSI (ISVLSI'03), 2003.

	BibTex	x
	@article{ 10.1109/ISVLSI.2003.1183367, author = {Maciej Bellos and Dimitri Kagaris and Dimitris Nikolos}, title = {Low Power Test Set Embedding Based on Phase Shifters}, journal ={VLSI, IEEE Computer Society Annual Symposium on}, volume = {0}, year = {2003}, isbn = {0-7695-1904-0}, pages = {155}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2003.1183367}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI, IEEE Computer Society Annual Symposium on TI - Low Power Test Set Embedding Based on Phase Shifters SN - 0-7695-1904-0 SP EP A1 - Maciej Bellos, A1 - Dimitri Kagaris, A1 - Dimitris Nikolos, PY - 2003 KW - null VL - 0 JA - VLSI, IEEE Computer Society Annual Symposium on ER -

Maciej Bellos, University of Patras; Computer Technology Institute

Dimitri Kagaris, Southern Illinois University

Dimitris Nikolos, University of Patras; Computer Technology Institute

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2003.1183367

A new efficient method for test set embedding based on phase shifters was recently proposed. This method suffers from high average and peak power consumption. In this work we propose a new phase shifter-based test set embedding method, which, by using interleaving and two LFSRs that change state in a non-overlapping way, significantly reduces the average and peak power consumption.

Citation:

Maciej Bellos, Dimitri Kagaris, Dimitris Nikolos, "Low Power Test Set Embedding Based on Phase Shifters," isvlsi, pp.155, IEEE Computer Society Annual Symposium on VLSI (ISVLSI'03), 2003

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