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5th International Symposium on Quality Electronic Design (ISQED'04)
Concurrent Error Detection for Combinational and Sequential Logic via Output Compaction
San Jose, California
March 22-March 24
ISBN: 0-7695-2093-6
Sobeeh Almukhaizim, Yale University
Petros Drineas, Rensselaer Polytechnic Institute
Yiorgos Makris, Yale University
We discuss the problem of non-intrusive concurrent error detection (CED) for random logic. We analyze the optimal solution model and we point out the limitations that prevent logic synthesis from yielding a minimal cost implementation. We explain how duplication-based CED exploits decomposition to alleviate these limitations for the unrestricted error model. We then examine a compaction-based CED method, which employs a similar decomposition principle to alleviate synthesis limitations for restricted error models. We demonstrate the cost reduction achieved by the decomposed method through experimental results and we discuss the points where optimality is lost, possible remedies, and extension to finite state machines (FSMs).
Citation:
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris, "Concurrent Error Detection for Combinational and Sequential Logic via Output Compaction," isqed, pp.459-464, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004
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