loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
5th International Symposium on Quality Electronic Design (ISQED'04)
Full-Chip Analysis Method of ESD Protection Network
San Jose, California
March 22-March 24
ISBN: 0-7695-2093-6
Sachio Hayashi, Toshiba Corporation Semiconductor Company
Fumihiro Minami, Toshiba Corporation Semiconductor Company
Masaaki Yamada, Toshiba Microelectronics Corporation
With the advance of process technology, electrostatic discharge (ESD) problem becomes more and more serious. To prevent design iterations caused by ESD failures, it is necessary to verify ESD protection network at design stage. In this paper, we present a full-chip analysis method of ESD protection network, which can analyze pad voltages for every pair of pads. Since the proposed method combines the merits of shortest path search and circuit simulation, it can analyze pad voltages more accurately than shortest path search with a little overhead of run time. The experimental results show that the proposed method can predict the reduction effect of pad voltage by ESD remedy. And it is shown that for a chip with 858 pads, the proposed method can analyze pad voltages of every pair of pads within 2 hours.
Citation:
Sachio Hayashi, Fumihiro Minami, Masaaki Yamada, "Full-Chip Analysis Method of ESD Protection Network," isqed, pp.439-444, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004
Usage of this product signifies your acceptance of the Terms of Use.