5th International Symposium on Quality Electronic Design (ISQED'04)
Methodology for Automated Layout Migration for 90 nm Itanium®2 Processor Design
San Jose, California
March 22-March 24
ISBN: 0-7695-2093-6
Unlike past semiconductor manufacturing processes, nanometer technology has seen an exponential growth of complex design rules and constraints. As a result, direct optical shrink of products between process nodes is becoming less feasible. To facilitate aggressive time-to-market requirements by re-using designs under new process technology, new CAD automation tools and methodologies have been developed. This paper describes a process shifting flow of 130nm custom layout to 90nm. Design challenges at the new process will first be overviewed, followed by EDA-assisted layout migration. Finally, productivity gains together with the design qualities will be shown on the implementation of a next generation Itanium?2 server chip.
Citation:
Kuang-Kuo Lin, Sudhakar Kale, Aditi Nigam, "Methodology for Automated Layout Migration for 90 nm Itanium®2 Processor Design," isqed, pp.31-35, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004