loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
5th International Symposium on Quality Electronic Design (ISQED'04)
Methodology for Automated Layout Migration for 90 nm Itanium®2 Processor Design
San Jose, California
March 22-March 24
ISBN: 0-7695-2093-6
Kuang-Kuo Lin, Intel Corporation
Sudhakar Kale, Intel Corporation
Aditi Nigam, Intel Corporation
Unlike past semiconductor manufacturing processes, nanometer technology has seen an exponential growth of complex design rules and constraints. As a result, direct optical shrink of products between process nodes is becoming less feasible. To facilitate aggressive time-to-market requirements by re-using designs under new process technology, new CAD automation tools and methodologies have been developed. This paper describes a process shifting flow of 130nm custom layout to 90nm. Design challenges at the new process will first be overviewed, followed by EDA-assisted layout migration. Finally, productivity gains together with the design qualities will be shown on the implementation of a next generation Itanium?2 server chip.
Citation:
Kuang-Kuo Lin, Sudhakar Kale, Aditi Nigam, "Methodology for Automated Layout Migration for 90 nm Itanium®2 Processor Design," isqed, pp.31-35, 5th International Symposium on Quality Electronic Design (ISQED'04), 2004
Usage of this product signifies your acceptance of the Terms of Use.