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Fourth International Symposium on Quality Electronic Design
Elimination of false aggressors using the functional relationship for full-chip crosstalk analysis
San Jose, California
March 24-March 26
ISBN: 0-7695-1881-8
Jae-Seok Yang, Samsung Electronics
Jeong-Yeol Kim, Samsung Electronics
Joon-Ho Choi, Samsung Electronics
Moon-Hyun Yoo, Samsung Electronics
Jeong-Taek Kong, Samsung Electronics
As the portion of coupling capacitance increases in smaller process geometries, accurate coupled noise analysis is becoming more important in current design methodologies. We propose a method to determine whether aggressors can potentially switch simultaneously with the victim or not. The functional information is used to classify the aggressors. Our functional pruning algorithm inspects the conflict of the net states using CNF(Conjunction Normal Form) and BDD(Binary Decision Diagram). We present the experimental results on several industrial circuits. In the experiments, 6.4% of total aggressors are false and the accuracy of delay calculation can be improved up to 36.6%.
Citation:
Jae-Seok Yang, Jeong-Yeol Kim, Joon-Ho Choi, Moon-Hyun Yoo, Jeong-Taek Kong, "Elimination of false aggressors using the functional relationship for full-chip crosstalk analysis," isqed, pp.344, Fourth International Symposium on Quality Electronic Design, 2003
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