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International Symposium on Quality Electronic Design (ISQED '01)
VSIA Quality Metrics for IP and SoC
San Jose, California
March 26-March 28
ISBN: 0-7695-1025-6
ASCII Text
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Mark Birnbaum, Charlene C. Johnson, "VSIA Quality Metrics for IP and SoC," Quality Electronic Design, International Symposium on, pp. 279, International Symposium on Quality Electronic Design (ISQED '01), 2001.
 
 
BibTex
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@article{ 10.1109/ISQED.2001.915243,
author = {Mark Birnbaum and Charlene C. Johnson},
title = {VSIA Quality Metrics for IP and SoC},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2001},
isbn = {0-7695-1025-6},
pages = {279},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2001.915243},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - VSIA Quality Metrics for IP and SoC
SN - 0-7695-1025-6
SP
EP
A1 - Mark Birnbaum,
A1 - Charlene C. Johnson,
PY - 2001
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
Mark Birnbaum, Fujitsu Microelectronics, Inc.
Charlene C. Johnson, Intel Corp.
A Study Group of the Virtual Socket Interface Alliance has produced a comprehensive approach to measuring IP and SoC quality. A highly usable tool, the Quality Evaluation Spreadsheet (QES) was developed with a large set of quality attributes, metrics for each attribute, and a user importance (weight) for each attribute. The metrics are designed for rapid assessment by the IP provider and the IP integrator. The spreadsheet can be extended and tailored for individual company and SoC application. The QES can be used by an IP provider for: ? A simple checklist of quality factors & metrics ? Individual IP quality evaluation ? As an input to IP Integrators for evaluation. The QES can be used by the IP Integrator/customer for: ? evaluation of a single IP or ? comparison of IP from several IP providers, or ? for a whole SoC.
Citation:
Mark Birnbaum, Charlene C. Johnson, "VSIA Quality Metrics for IP and SoC," isqed, pp.279, International Symposium on Quality Electronic Design (ISQED '01), 2001
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