International Symposium on Quality Electronic Design (ISQED '01) A Compact Layout Technique for Reducing Switching Current Effects in High Speed Circuits San Jose, California March 26-March 28 ISBN: 0-7695-1025-6
A full-custom layout style and its cell model is presented. Its power supply and ground rails distribution is not only of very low self-inductance, but it is also independent of cell dimensions. Cell layouts following the proposed model reduces greatly switching current effects at high frequency. The underlying cell architecture is regular and suitable to design automation without sacrificing any advantages of the full-custom design. Layout channel density of a subset of MCNC'91 two-level circuit benchmarks have been obtained. Comparisons demonstrate that the layout of combinational circuits in the high speed cell model are compact and minimize the routing area. A cell compiler has be used as a cell library builder and it is embedded in a random logic macrocell and an iterative logic array generator. It is shown that the cell and macrocell compiler generates complex and compact layouts. The technique is demonstrated for GaAs processes up to 4GHz, but it can be directly applied to deep submicron CMOS processes as well.
Citation:
J.A. Montiel-Nelson, V de ARMAS, R. Sarmiento, And A. Nunez, "A Compact Layout Technique for Reducing Switching Current Effects in High Speed Circuits," isqed, pp.223, International Symposium on Quality Electronic Design (ISQED '01), 2001 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||