International Symposium on Quality Electronic Design (ISQED '01)
I/O Cell Placement and Electrical Checking Methodology for ASICs with Peripheral I/Os
San Jose, California
March 26-March 28
ISBN: 0-7695-1025-6
Optimized I/O cell placement techniques take into account electromigration (EM), IR drop, and dI/dt noise issues in the power distribution network. This paper describes fast and easy electrical checking algorithms to be used early in the design process to verify if the I/O placements meet placement guidelines, and explains the details of the I/O cell placement-related rules used by the checking tool. Use of these techniques and methods can ensure high quality ASICs.
Citation:
Gulsun Yasar, Charles Chiu, Robert A. Proctor, James P. Libous, "I/O Cell Placement and Electrical Checking Methodology for ASICs with Peripheral I/Os," isqed, pp.71, International Symposium on Quality Electronic Design (ISQED '01), 2001