A Transition Based BIST Approach for Passive Analog Circuits

I
ISQED
2000
First International Symposium on Quality of Electronic Design
Abstract - A Transition Based BIST Approach for Passive Analog Circuits

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	Similar Articles Articles by Alvernon Walker Articles by Parag K. Lala

First International Symposium on Quality of Electronic Design

San Jose, California

March 20-March 22

ISBN: 0-7695-0525-2

	ASCII Text	x
	Alvernon Walker, Parag K. Lala, "A Transition Based BIST Approach for Passive Analog Circuits," Quality Electronic Design, International Symposium on, pp. 347, First International Symposium on Quality of Electronic Design, 2000.

	BibTex	x
	@article{ 10.1109/ISQED.2000.838895, author = {Alvernon Walker and Parag K. Lala}, title = {A Transition Based BIST Approach for Passive Analog Circuits}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2000}, isbn = {0-7695-0525-2}, pages = {347}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2000.838895}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - A Transition Based BIST Approach for Passive Analog Circuits SN - 0-7695-0525-2 SP EP A1 - Alvernon Walker, A1 - Parag K. Lala, PY - 2000 KW - Built-in Self Test KW - Analog Test KW - Mixed-Signal BIST KW - Analog BIST VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Alvernon Walker, University of Tennessee

Parag K. Lala, University of Arkansas

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2000.838895

A new Mixed-Signal Built-in Self-test approach that is based upon voltage transitions at the primary output of the analog block under test (CUT) is presented in this paper. This CUT output is the pulse response of the CUT for a rail-to-rail pulse stream. The technique can effectively detect both soft and hard faults and does not require an analog-to-digital converter (ADC) or/and digital-to-analog converter (DAC). This approach also does not require any additional analog circuits to realize the test signal generator and sample circuits. The paper is concluded with an example of the application of the proposed approach for a passive second order notch filter.

Index Terms:

Built-in Self Test, Analog Test, Mixed-Signal BIST, Analog BIST

Citation:

Alvernon Walker, Parag K. Lala, "A Transition Based BIST Approach for Passive Analog Circuits," isqed, pp.347, First International Symposium on Quality of Electronic Design, 2000

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