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First International Symposium on Quality of Electronic Design
Noise Safety Design Methodologies
San Jose, California
March 20-March 22
ISBN: 0-7695-0525-2
ASCII Text
x 
 
M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni, "Noise Safety Design Methodologies," Quality Electronic Design, International Symposium on, pp. 157, First International Symposium on Quality of Electronic Design, 2000.
 
 
BibTex
x
 
@article{ 10.1109/ISQED.2000.838869,
author = {M. Graziano and M. Delaurenti and G. Masera and G. Piccinini and M. Zamboni},
title = {Noise Safety Design Methodologies},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2000},
isbn = {0-7695-0525-2},
pages = {157},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2000.838869},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - Noise Safety Design Methodologies
SN - 0-7695-0525-2
SP
EP
A1 - M. Graziano,
A1 - M. Delaurenti,
A1 - G. Masera,
A1 - G. Piccinini,
A1 - M. Zamboni,
PY - 2000
KW - Noise
KW - Noise Models
KW - Electromigration Safety
KW - Noise Tolerance
KW - Deep-submicron Design Reliability
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
M. Graziano, Politecnico di Torino
M. Delaurenti, Politecnico di Torino
G. Masera, Politecnico di Torino
G. Piccinini, Politecnico di Torino
M. Zamboni, Politecnico di Torino
The increasing densities in growing size circuits leads to consider as an issue noise problems as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, which development must then include circuit models for the analysis of noise phenomena. This paper point out a proposed methodology in the developing of new models and related tools that focuses on noise immunity of circuit design.
Index Terms:
Noise, Noise Models, Electromigration Safety, Noise Tolerance, Deep-submicron Design Reliability
Citation:
M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni, "Noise Safety Design Methodologies," isqed, pp.157, First International Symposium on Quality of Electronic Design, 2000
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