First International Symposium on Quality of Electronic Design Measuring Design Quality by Measuring Design Complexity San Jose, California March 20-March 22 ISBN: 0-7695-0525-2
Chips continue to get larger and more complex, and as they do, design quality continues to become more difficult and more important. Improving quality metrics is a key to addressing this problem, both for measuring quality and for predicting design quality early in the design cycle. This paper proposes a method of quantifying design complexity, enabling design teams to produce architectures and implementations that manage complexity, and hence quality, effectively
Index Terms:
quality, metrics, design complexity
Citation:
Michael Keating, "Measuring Design Quality by Measuring Design Complexity," isqed, pp.103, First International Symposium on Quality of Electronic Design, 2000 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||