M. Keim, N. Drechsler, R. Drechsler, B. Becker, "Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm," Multiple-Valued Logic, IEEE International Symposium on, pp. 215, The 28th International Symposium on Multiple-Valued Logic, 1998.

@article{ 10.1109/ISMVL.1998.679435,
author = {M. Keim and N. Drechsler and R. Drechsler and B. Becker},
title = {Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm},
journal ={Multiple-Valued Logic, IEEE International Symposium on},
volume = {0},
year = {1998},
issn = {0195-623X},
pages = {215},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISMVL.1998.679435},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Multiple-Valued Logic, IEEE International Symposium on
TI - Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm
SN - 0195-623X
SP
EP
A1 - M. Keim,
A1 - N. Drechsler,
A1 - R. Drechsler,
A1 - B. Becker,
PY - 1998
VL - 0
JA - Multiple-Valued Logic, IEEE International Symposium on
ER -