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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Isle of Bendor, France
July 08-July 10
ISBN: 0-7695-1641-6
ASCII Text
x 
 
F. Kaddour, S. Rezgui, R. Velazco, S. Rodriguez, J. R. De Mingo, "Error Rate Estimation for a Flight Application Using the CEU Fault Injection Approach," On-Line Testing Workshop, IEEE International, pp. 195, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002.
 
 
BibTex
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@article{ 10.1109/OLT.2002.1030218,
author = {F. Kaddour and S. Rezgui and R. Velazco and S. Rodriguez and J. R. De Mingo},
title = {Error Rate Estimation for a Flight Application Using the CEU Fault Injection Approach},
journal ={On-Line Testing Workshop, IEEE International},
volume = {0},
year = {2002},
isbn = {0-7695-1641-6},
pages = {195},
doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030218},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - On-Line Testing Workshop, IEEE International
TI - Error Rate Estimation for a Flight Application Using the CEU Fault Injection Approach
SN - 0-7695-1641-6
SP
EP
A1 - F. Kaddour,
A1 - S. Rezgui,
A1 - R. Velazco,
A1 - S. Rodriguez,
A1 - J. R. De Mingo,
PY - 2002
KW - null
VL - 0
JA - On-Line Testing Workshop, IEEE International
ER -
 
F. Kaddour, TIMA Laboratory
S. Rezgui, TIMA Laboratory
R. Velazco, TIMA Laboratory
This paper aims at validating the efficiency of a fault injection approach to predict error rate on applications devoted to operate in radiation environment. Soft error injection experiments and radiation ground testing were performed on software modules using a digital board built on a digital signal processor which is included in a satellite instrument. The analysis of experimental results put in evidence the potentialities offered by the used methodology to predict the error rate of complex applications.
Citation:
F. Kaddour, S. Rezgui, R. Velazco, S. Rodriguez, J. R. De Mingo, "Error Rate Estimation for a Flight Application Using the CEU Fault Injection Approach," ioltw, pp.195, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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